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after they are produced.

Testing very-large-scale integrated circuits with a high fault coverage is a difficult task because of complexity. Different ATPG methods have to be applied to combinatorial and sequential circuits.

See also:

• Design for Test (DFT)
• Fault model
• ASIC
• VHSIC

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Topics: ATPG Circuits Design Digital Atpg Test Fault Methods Dft...

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ATPGAutomatic test pattern generation (ATPG systems are tools for generating tests for digital circuits after they are produced. Testing very-large-scale integrated circuits with a high fault coverage is a difficult task because of complexity. Different ATPG